Assessment of quality of trace element measurements by EDXRF technique: a statistical approach
Date
2004Author
Hashim, NO
Rathore, IVS
Kinyua, AM
Stangl, RL
Mustapha, AO
Type
ArticleLanguage
enMetadata
Show full item recordURI
http://www.sciencedirect.com/science/article/pii/S0969806X04002890http://hdl.handle.net/11295/66078
Citation
Radiation Physics and Chemistry Volume 71, Issues 3–4, October–November 2004, Pages 791–792Publisher
University of Nairobi