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dc.contributor.authorUniversity of Nairobi
dc.date.accessioned2015-05-20T09:01:32Z
dc.date.available2015-05-20T09:01:32Z
dc.date.issued2014-06
dc.identifier.urihttp://eie.uonbi.ac.ke/node/948
dc.identifier.urihttp://hdl.handle.net/11295/83283
dc.description.abstractEIE staff, Mr. Tom Oloo, Mr. Bonface Munyole and Ms Celestine Kavindu visited Elettronica Veneta Company, Italy to assess and sample test the equipment being purchased through MOEST/ADB projects.en_US
dc.language.isoenen_US
dc.publisherUniversity of Nairobien_US
dc.titleEIE staff visit to Elettronica Veneta, Italyen_US
dc.typeOtheren_US
dc.type.materialen_USen_US


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