| dc.description.abstract | Aluminum sheets were polished to reduce ruggedness and then textured in varying acid-ethanol
concentration etchant to form pores. The textured surface was characterized structurally by using
X-ray diffraction (XRD)which revealed aluminum crystallographic planes (1 1 1), (2 0 0), (2 2 0)
and (3 1 1). Its morphology was studied by using energy dispersive X-ray (EDX)and scanning
electron microscope (SEM)that confirmed purity of aluminum sheet to be 99.66% at. Reflectance
of textured and plain aluminum sheet was analyzed by spectrophotometric measurements which
showed that texturing reduced the reflectance of the polished surface by 26% in the UV-VIS-NIR
spectrum of solar radiation. With reduced reflectance of the textured aluminum sheet, it was applicable
for solar radiation absorption | en_US |
