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dc.contributor.authorYamakawa, K.
dc.contributor.authorwa Gachigi, K.
dc.contributor.authorTroiler-McKinstry, S.
dc.contributor.authorDougherty, J.P.
dc.date.accessioned2013-04-16T09:27:51Z
dc.date.available2013-04-16T09:27:51Z
dc.date.issued1996
dc.identifier.citationFerroelectrics Letters Section Volume 20, Issue 5-6, 1996en
dc.identifier.urihttp://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/16110
dc.description.abstractPhase transitions in antiferroelectric lead zirconate thin films were studied at room temperature and at 77 K. The lead zirconate films were prepared on Pt coated Si substrates by a reactive magnetron co-sputtering mthod followed by a rapid thermal annealing process at 700 °C. An electric field induced antiferroelectric — ferroelectric phase transition was observed at room temperature with a maximum polarization value of 70 μC/cm2. The average field required to induce the ferroelectric state and that for the reversion to the antiferroelectric state were 294 kV/cm and 179 kV/cm respectively. At 77 K a metastable ferroelectric — ferroelectric transition was observed with a maximum polarization of 58 μC/cm2. These transitions were found to be coincident with those of lead zirconate single crystals.en
dc.language.isoenen
dc.titlePhase Transitions of Antiferroelectric Lead Zirconate Thin Films in High Electric Fieldsen
dc.typeArticleen


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