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dc.contributor.authorKipng'eno, WK
dc.date.accessioned2013-05-23T13:47:03Z
dc.date.available2013-05-23T13:47:03Z
dc.date.issued1984-06
dc.identifier.citationDoctor of Philosophy in applied statistics,University of Nairobi,June,1984.en
dc.identifier.urihttp://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/24979
dc.description.abstractIn this dissertation, we discuss the sensitivity of optimum balanced 2m fractional designs of resolutiun V to outliers using the measure suggested by Box and Draper (1975). In addition, we define a new measure of robustness of design with respect to outliers , which we called the "0ut- lier-insensitivity factor". Various properties of these two measures of robustness of designs (with respect to outliers) will be outlined. The optimum balanced resolution V plans are known in the literature for practical values of m and the number of observations. For Srivastava-chopra optimum balanced resolution V plans for 2m factorial design we first simplified expressions for these two measures of insensitivity. We then find their values for optimum designs when 4<m<8, and it will be shown that sensitivities to outliers of these optimum designs are low,en
dc.language.isoenen
dc.publisherUniversity of Nairobien
dc.titleStudy on outliers in factorial design of experimentsen
dc.typeThesisen
local.publisherDepartment of Commerceen


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