dc.contributor.author | Kipng'eno, WK | |
dc.date.accessioned | 2013-05-23T13:47:03Z | |
dc.date.available | 2013-05-23T13:47:03Z | |
dc.date.issued | 1984-06 | |
dc.identifier.citation | Doctor of Philosophy in applied statistics,University of Nairobi,June,1984. | en |
dc.identifier.uri | http://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/24979 | |
dc.description.abstract | In this dissertation, we discuss the sensitivity of optimum balanced
2m fractional designs of resolutiun V to outliers using the measure suggested
by Box and Draper (1975). In addition, we define a new measure of
robustness of design with respect to outliers , which we called the "0ut-
lier-insensitivity factor". Various properties of these two measures of
robustness of designs (with respect to outliers) will be outlined. The
optimum balanced resolution V plans are known in the literature for practical
values of m and the number of observations. For Srivastava-chopra
optimum balanced resolution V plans for 2m factorial design we first simplified
expressions for these two measures of insensitivity. We then find
their values for optimum designs when 4<m<8, and it will be shown that sensitivities
to outliers of these optimum designs are low, | en |
dc.language.iso | en | en |
dc.publisher | University of Nairobi | en |
dc.title | Study on outliers in factorial design of experiments | en |
dc.type | Thesis | en |
local.publisher | Department of Commerce | en |