Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks
Citation
MSc. Thesis. Sequential Circuit Testability Parameter Prediction using Artificial Neural Networks. Shanghai University, 1996, W, DR. WAGACHA PETER , Proceedings of the Third Conference on Information Technology and Economic Development. 2004 Ghana .INTERCED, (1996) copy at http://profiles.uonbi.ac.ke/waiganjo/publications/msc-thesis-sequential-circuit-testability-parameter-prediction-using-artificialPublisher
University of Nairobi School of computing and informatics