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dc.contributor.authorRading, G O
dc.contributor.authorBerry, J.T
dc.contributor.authorShamsuzzoha, M
dc.date.accessioned2013-06-27T12:42:31Z
dc.date.available2013-06-27T12:42:31Z
dc.date.issued1994
dc.identifier.citationO, PROFRADINGGEORGE. 1994. G.O. Rading, M. Shamsuzzoha and J.T. Berry "A TEM and High Resolution Microstructural Characterization of the Al-Li-Cu Alloy 2095 in the T8 Temper Condition" ACEM-13: 13th. Conf. Australian Society for Electron Microscopy, Brisbane (1994). Mountain Research and Development, vol. 8, no. 2.. : 2011en
dc.identifier.urihttp://cae.uonbi.ac.ke/uon_publications/author/3021
dc.identifier.urihttp://hdl.handle.net/11295/41199
dc.language.isoenen
dc.titleA TEM And High Resolution Microstructural Characterization Of The Al-Li-Cu Alloy 2095 In The T8 Temper Conditionen
dc.typePresentationen
local.publisherMechanical and Manufacturing Engineering, University of Nairobien


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