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Assessment of quality of trace element measurements by EDXRF technique: a statistical approach

dc.contributor.authorHashim, NO
dc.contributor.authorRathore, IVS
dc.contributor.authorKinyua, AM
dc.contributor.authorStangl, RL
dc.contributor.authorMustapha, AO
dc.date.accessioned2014-04-28T09:09:53Z
dc.date.available2014-04-28T09:09:53Z
dc.date.issued2004
dc.identifier.citationRadiation Physics and Chemistry Volume 71, Issues 3–4, October–November 2004, Pages 791–792en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S0969806X04002890
dc.identifier.urihttp://hdl.handle.net/11295/66078
dc.language.isoenen_US
dc.publisherUniversity of Nairobien_US
dc.titleAssessment of quality of trace element measurements by EDXRF technique: a statistical approachen_US
dc.typeArticleen_US


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