| dc.contributor.author | Rai, BP | |
| dc.date.accessioned | 2014-04-30T06:24:20Z | |
| dc.date.available | 2014-04-30T06:24:20Z | |
| dc.date.issued | 1982-08 | |
| dc.identifier.citation | Thin Solid Films Volume 94, Issue 2, 13 August 1982, Pages 115–117 | en_US |
| dc.identifier.uri | http://www.sciencedirect.com/science/article/pii/004060908290503X | |
| dc.identifier.uri | http://hdl.handle.net/11295/66167 | |
| dc.description.abstract | Measurements of the dielectric loss in thin Al2O3 films at low and very low frequencies are reported. A very simple but efficient experimental technique for measuring the loss tangent was used in the study. A Debye-type relaxation peak was observed and this is discussed. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | University of Nairobi | en_US |
| dc.title | Low Frequency Dielectric Loss Measurements On Al2o3 Films | en_US |
| dc.type | Article | en_US |
