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dc.contributor.authorHastenrath, Stefan
dc.contributor.authorPatnaik, J. K.
dc.date.accessioned2014-07-11T06:05:20Z
dc.date.available2014-07-11T06:05:20Z
dc.date.issued1980
dc.identifier.citationHastenrath, Stefan., Patnaik, J K., (1980). Radiation Measurements Mount Kenya. Jounud of Glaciology, 25 (93), PP.439-444en_US
dc.identifier.urihttp://hdl.handle.net/11295/72637
dc.description.abstractABSTRACT. Short- and long-wave radiation on variously oriented vertical surfaces, direct solar radiation, global radiation, and long-wave radiation on a horizontal surface were measured on Lewis Glacier, Mount Kenya, at 4 800 m. For the orientation of vertical surfaces, the following azimuths were selected: 45°, facing the steep slope of the upper glacier; 135°, facing a rock ridge and some glacier surface in the foreground; 225°, facing down-glacier towards the Teleki valley with open sky occupying much of the view; and 315°, directed towards the steep south-east face of the Nelion peak. The horizontal components of diffuse short-wave radiation reach a magnitude comparable to those of direct radiation. As a result of contrastingly different albedos of natural surfaces, the horizontal component of diffuse short-wave radiation is particularly large from the direction of the upper glacier, with values around 330-500 W m-', and smallest from the direction of the rock face of Nelion peak, where values are around 150-330 W m-'. Long-wave radiation seems enhanced from the direction of the Nelion face, and reduced from the azimuth of the upper glacier, thus apparently reflecting differences in emissivity and temperature.en_US
dc.language.isoenen_US
dc.publisherUniversity of Nairobien_US
dc.titleRadiation Measurements Mount Kenya, At Lewis Kenyaen_US
dc.type.materialen_USen_US


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