Dielectric loss measurements on raw materials
| dc.contributor.author | Mwanje, J. | |
| dc.date.accessioned | 2014-07-11T07:16:15Z | |
| dc.date.available | 2014-07-11T07:16:15Z | |
| dc.date.issued | 1980 | |
| dc.identifier.citation | Am. J. Phys. 48, 837 (1980) | en_US |
| dc.identifier.uri | http://scitation.aip.org/content/aapt/journal/ajp/48/10/10.1119/1.12234 | |
| dc.identifier.uri | http://hdl.handle.net/11295/72671 | |
| dc.description | ARTICLE | en_US |
| dc.description.abstract | This paper describes a relatively simple experiment which can be performed by undergraduate students to study the dielectric properties of materials. Values of the dielectric loss tangent can be determined at low frequencies from Lissajous figures formed on an oscilloscope. Sample results for mineral rock specimens are presented. Some of these specimens show Debye‐type relaxation peaks at frequencies in the region of 1 to 500 Hz. Such losses can be reasonably represented by an equivalent circuit. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | University of Nairobi, | en_US |
| dc.title | Dielectric loss measurements on raw materials | en_US |
| dc.type.material | en | en_US |
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