Effects of Early and Late Harvest on Agronomic Performance and Stability of Late Blight Resistant (R-gene Free) Potato Genotypes
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Date
2014Author
Nyankanga, Richard
Kiplagat, Willy
Rama, Narla
Shibairo, Solomon
Kabira, Jackson
Landeo, Juan
Olanya, Modesto
Language
enMetadata
Show full item recordAbstract
Late blight is an important constraint to potato production and genotype resistance is an effective disease control mesure. Ten late
blight resistant potato genotypes (R-gene free) were assessed for yield performance and stability at early (90 days) and late harvest
(120 days) at two locations in Kenya during two years. Significant differences (
P
<
0.05) in area under disease progress curves
(AUDPC) were detected among potato genotypes. Resistant genotypes free of R-genes had significantly (
P
<
0.05) higher yield at
late than early harvest, perhaps due to increased tuber bulking period. The rank of genotypes for AUDPC, late blight resistance, and
tuber yield varied across seasons and locations (environment). Additive main effects and multiplicative interaction (AMMI) analysis
of tuber yield and late blight resistance resulted in significant (
P
<
0.05) effects of genotypes (G) and environments (E). The propor-
tion of genotypic variance was larger than the environmental variance and the G
×
E
interactions. For tuber yield, the G, E, and G
×
E
interactions accounted for 42.9, 39.6 and 17.5%; and 53.4, 29.7, and 16.9% at early and late harvests, respectively. For
AUDPC, G, E, and G
×
E
accounted for 80.2, 5.0, and 14.8%; as well as 82.3, 4.6, and 13% for early and late harvests, respectively.
The resistance of potato genotypes without R-genes varied. Selective deployment of resistant genotypes can improve potato tuber
yield
Citation
Richard Nyankanga, Willy Kiplagat, Rama Narla, Solomon Shibairo, Jackson Kabira, Juan Landeo, Modesto Olanya (2014). Effects of Early and Late Harvest on Agronomic Performance and Stability of Late Blight Resistant (R-gene Free) Potato Genotypes. Journal of Crop Science and Biotechnology, 17(2), pp 89-9Publisher
University of Nairobi