Browsing Faculty of Science & Technology (FST) by Author "Rai, BP"
Now showing items 1-1 of 1
-
Low Frequency Dielectric Loss Measurements On Al2o3 Films
Rai, BP (University of Nairobi, 1982-08)Measurements of the dielectric loss in thin Al2O3 films at low and very low frequencies are reported. A very simple but efficient experimental technique for measuring the loss tangent was used in the study. A Debye-type ...