Browsing Faculty of Science & Technology (FST) by Author "Van Grieken, R"
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Determination of rare earth elements in geological materials by total reflection x-ray fluorescence
Muia, L; Van Grieken, R (University of Nairobi, 1991)The use of a basic total reflection x-ray fluorescence (TXRF) unit coupled to a fine structure Mo x-ray tube for the determination of rare earth elements (REEs) in geological materials was investigated. Three certified ...