EIE staff visit to Elettronica Veneta, Italy
dc.contributor.author | University of Nairobi | |
dc.date.accessioned | 2015-05-20T09:01:32Z | |
dc.date.available | 2015-05-20T09:01:32Z | |
dc.date.issued | 2014-06 | |
dc.identifier.uri | http://eie.uonbi.ac.ke/node/948 | |
dc.identifier.uri | http://hdl.handle.net/11295/83283 | |
dc.description.abstract | EIE staff, Mr. Tom Oloo, Mr. Bonface Munyole and Ms Celestine Kavindu visited Elettronica Veneta Company, Italy to assess and sample test the equipment being purchased through MOEST/ADB projects. | en_US |
dc.language.iso | en | en_US |
dc.publisher | University of Nairobi | en_US |
dc.title | EIE staff visit to Elettronica Veneta, Italy | en_US |
dc.type | Other | en_US |
dc.type.material | en_US | en_US |
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