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    Testability Prediction for Sequential Circuits Using Neural Network

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    Date
    1997
    Author
    Wagacha, P W
    Type
    Article
    Language
    en
    Metadata
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    URI
    http://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/44786
    Citation
    Xu, S, Waiganjo P, Dias PG, Shi B. 1997. Testability Prediction for Sequential Circuits Using Neural Network. Proceedings of the 6th Asian Test Symposium. :48–., Washington, DC, USA: IEEE Computer Society
    Publisher
    University of Nairobi
     
    College of biological and physical science
     
    Collections
    • Faculty of Science & Technology (FST) [4265]

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