Testability Prediction for Sequential Circuits Using Neural Network
| dc.contributor.author | Wagacha, P W | |
| dc.date.accessioned | 2013-07-03T13:31:13Z | |
| dc.date.available | 2013-07-03T13:31:13Z | |
| dc.date.issued | 1997 | |
| dc.identifier.citation | Xu, S, Waiganjo P, Dias PG, Shi B. 1997. Testability Prediction for Sequential Circuits Using Neural Network. Proceedings of the 6th Asian Test Symposium. :48–., Washington, DC, USA: IEEE Computer Society | en |
| dc.identifier.uri | http://erepository.uonbi.ac.ke:8080/xmlui/handle/123456789/44786 | |
| dc.language.iso | en | en |
| dc.publisher | University of Nairobi | en |
| dc.title | Testability Prediction for Sequential Circuits Using Neural Network | en |
| dc.type | Article | en |
| local.publisher | College of biological and physical science | en |
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