Investigation of the Effect of film Thickness on the Optical Properties of Amorphous Se 85-xTe15Sbx
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Date
2014Author
Mwabora, Julius M.
Mulama Austine A.
Oduor Andrew O.
Cosmas M. Muiva
Muthoka Boniface
Language
enMetadata
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Amorphous thin films of Se85-xTe15Sbx (x = 0.0, 0.5, 2.5, and 5.0 at. %) deposited by flash evaporation technique,
have been investigated in the wavelength range of 500nm-3000nm. It is found that the effect of increasing antimony
content and film thickness on the as-deposited films led to increase in the absorption coefficient. The optical band
gap energy decreased with increase in antimony concentration but increased with increase in film thickness.
Citation
Mwabora, Julius M. "Investigation of the Effect of film Thickness on the Optical Properties of Amorphous Se 85-xTe15Sbx." , African Journal of Physical Sciences . 2014;1(1):38-42 .Publisher
University of Nairobi