| dc.contributor.author | Mwabora, Julius M. | |
| dc.contributor.author | Mulama Austine A. | |
| dc.contributor.author | Oduor Andrew O. | |
| dc.contributor.author | Cosmas M. Muiva | |
| dc.contributor.author | Muthoka Boniface | |
| dc.contributor.author | | |
| dc.date.accessioned | 2014-12-22T09:32:34Z | |
| dc.date.available | 2014-12-22T09:32:34Z | |
| dc.date.issued | 2014 | |
| dc.identifier.citation | Mwabora, Julius M. "Investigation of the Effect of film Thickness on the Optical Properties of Amorphous Se 85-xTe15Sbx." , African Journal of Physical Sciences . 2014;1(1):38-42 . | en_US |
| dc.identifier.uri | http://hdl.handle.net/11295/78207 | |
| dc.identifier.uri | http://journals.uonbi.ac.ke/index.php/ajps/article/view/1224 | |
| dc.description.abstract | Amorphous thin films of Se85-xTe15Sbx (x = 0.0, 0.5, 2.5, and 5.0 at. %) deposited by flash evaporation technique,
have been investigated in the wavelength range of 500nm-3000nm. It is found that the effect of increasing antimony
content and film thickness on the as-deposited films led to increase in the absorption coefficient. The optical band
gap energy decreased with increase in antimony concentration but increased with increase in film thickness. | |
| dc.language.iso | en | en_US |
| dc.publisher | University of Nairobi | en_US |
| dc.title | Investigation of the Effect of film Thickness on the Optical Properties of Amorphous Se 85-xTe15Sbx | en_US |
| dc.type | Article | en_US |
| dc.type.material | es | en_US |
